Session 5: Power grid metrology


Christian Mester, Switzerland
Roel de Vries, The Netherlands

16:30-16:50 Christian Mester
The role of National Metrology Institutes, the International System of Units and The Concept of Traceability
16:50-17:10 Charles Ané, Jean-Pierre Braun
Establishing Traceability for Flickermeters
17:10-17:30 William Dickerson, Allen Goldstein, Harold Kirkham,  Kenneth Martin, Andrew Roscoe, Roel de Vries,  Paul Wright
Smart Grid Measurement Uncertainty: Definitional and Influence Quantity Considerations
17:30-17:50  Renan Gabriel Quijano Cetina, Andrew Roscoe, Alejandro Arturo Castillo Atoche
Low-Cost Power Systems Metrology Laboratory Based on Raspberry Pi

Event Timeslots (1)

Thursday (26.4.)