Dr.ir. Gert Rietveld
Keynote talk: Intelligent Grid Metrology: Measurement Science for a Reliable Electricity Supply
Metrology is at the heart of the present development of intelligent grids: there is no such thing like an intelligent grid without measurements. This presentation will highlight the significant contributions metrology presently is making to the development of intelligent grids, with an outlook to the challenges that still lie ahead. This will among others cover the calibration of PMUs and digital instrumentation for grid monitoring and control, ensuring correct metering under highly polluted grid conditions, measurement of power quality up to the supraharmonics range, testing of grid components at increasingly high grid voltage levels, and reliable efficiency measurements of power transformers and reactors. The challenges are unprecedented, with needs for traceability of digital instrumentation, for on-site measurement in grids and at test sites, and for metrology support to data analytics aiming to turn the vast amounts of grid measurement data into actionable information for grid operators.
Dr.ir. Gert Rietveld
Chief Metrologist, VSL
Gert is Chief Metrologist at VSL, the national measurement institute of the Netherlands. After two decades of work on electrical quantum standards, his current research focuses on power and energy metrology and in particular metrology for smart electrical grids. He has coordinated a 22-partner EU project on Smart Grid Metrology, was the founding chair of the EURAMET expert group on power and energy, and he presently is leading the European Metrology Network on Smart Electricity Grids. He has published over 180 articles in transactions, journals and proceedings.
Dr. Rietveld is member of the International Committee for Weights and Measures and President of its Consultative Committee for Electricity and Magnetism (CCEM). He is a senior IEEE member, and member of several EURAMET, CIGRE, and IEEE Working Groups.
Gert Rietveld received the M.Sc. (cum laude) and Ph.D. degrees in low temperature and solid-state physics from the Delft University of Technology, The Netherlands, in 1988 and 1993, respectively.